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The Sub-Electron-Volt-Sub-Angstrom-Microscope (SESAM): Pushing the Limits in Monochromated and Energy-Filtered TEM.

Published online by Cambridge University Press:  05 August 2007

PA van Aken ,
CT Koch ,
W Sigle ,
R Höschen ,
M Rühle ,
E Essers ,
G Benner  and
M Matijevic
PA van Aken
Affiliation:
Max Planck Institute for Metals Research
CT Koch
Affiliation:
Max Planck Institute for Metals Research
W Sigle
Affiliation:
Max Planck Institute for Metals Research
R Höschen
Affiliation:
Max Planck Institute for Metals Research
M Rühle
Affiliation:
Max Planck Institute for Metals Research
E Essers
Affiliation:
Carl Zeiss SMT
G Benner
Affiliation:
Carl Zeiss SMT
M Matijevic
Affiliation:
Carl Zeiss SMT
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 862 - 863
Copyright
© 2007 Microscopy Society of America

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