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New Development of a Wavelength-dispersive X-ray Spectrometer up to 2 keV for a Conventional Analytical Transmission Electron Microscope

Published online by Cambridge University Press:  05 August 2007

T Masami ,
Y Yuichi  and
K Masato
T Masami
Affiliation:
Tohoku University,Japan
Y Yuichi
Affiliation:
Tohoku University,Japan
K Masato
Affiliation:
JAEA,Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 166 - 167
Copyright
© 2007 Microscopy Society of America

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