NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy

SC Minne; Y Hu; S Hu; B Pittenger; C Su

doi:10.1017/S1431927610061829

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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NanoScale Quantitative Mechanical Property Mapping Using Peak Force Tapping Atomic Force Microscopy

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