Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-05-13T13:02:36.828Z Has data issue: false hasContentIssue false
  • English
  • Français

Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage

Published online by Cambridge University Press:  23 September 2015

Y. Hashimoto ,
A. Muto ,
T. Walters ,
E. Woods  and
D. C. Joy
Y. Hashimoto
Affiliation:
Nano-Technology Systems Div., Hitachi High Technologies America, Clarksburg, MD 20871, USA
A. Muto
Affiliation:
Nano-Technology Systems Div., Hitachi High Technologies America, Clarksburg, MD 20871, USA
T. Walters
Affiliation:
Institute for Electronics and Nanotechnology, Georgia Institute of Technology, Atlanta, GA 30332, USA
E. Woods
Affiliation:
Institute for Electronics and Nanotechnology, Georgia Institute of Technology, Atlanta, GA 30332, USA
D. C. Joy
Affiliation:
Material Science and Engineering, University of Tennessee, Knoxville, TN 37831, USA Center for Nanophase Materials Science, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 837 - 838
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Hashimoto, Y., et al., Microsc. Microanal. 19(Suppl 2), 1176–1177 (2013).CrossRefGoogle Scholar
[2] Hashimoto, Y., et al., Microsc. Microanal. 20(Suppl 3), 34–35 (2014).Google Scholar
[3] Mullerova, Ilona, Scanning 23, 379 (2001).CrossRefGoogle ScholarPubMed