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XPS Spectromicroscopy as an Optimised Technique for Materials Characterisation.

Published online by Cambridge University Press:  25 July 2016

D. Surman ,
C. Moffitt ,
A. J. Roberts ,
S. J. Coultas ,
J. D. P. Counsell  and
C. J. Blomfield
D. Surman
Affiliation:
Kratos Analytical Inc., 100 Red Schoolhouse Road, Chestnut Ridge, NY
C. Moffitt
Affiliation:
Kratos Analytical Inc., 100 Red Schoolhouse Road, Chestnut Ridge, NY
A. J. Roberts
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
S. J. Coultas
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
J. D. P. Counsell
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK
C. J. Blomfield
Affiliation:
Kratos Analytical Ltd, Wharfside, Trafford Wharf Road, Manchester, M17 1GP, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 380 - 381
Copyright
© Microscopy Society of America 2016 

References

References:

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